GE OMX-SR Super-Resolution Microscope
3D Structure Illumination (3D-SIM), TIRF Structured Illumination (TIRF-SIM)
Model Information
General Electric Deltavision OMX-SR super-resolution microscope
Installed: September 29, 2017 (initial training October 12, 2017)
Specifications:
Structured illumination provides twice the resolution (super-resolution, compared to standard confocal microscopy) in all 3-dimensions. TIRF-SIM even better resolution for region closest to coverslips
Alternative light path upon request for Ring-TIRF (artifact-free TIRF), photoactivated localization microscopy (PALM super-resolution) and fast wide-field/deconvolution
Laser-based hardware autofocus for long-term imaging stability
Three high-speed high-sensitivity PCO sCMOS cameras (2560×2160, but limited to 1024×1024 for SIM super-resolution imaging)
Fast high-resolution nanomover (coarse) and piezo-driven (fine) specimen stage; total range 24x48mm
Dedicated 37°C heater/CO2/humidity for 35mm dishes or multiwell chamber coverslips (Use #1.5 coverslips; Cannot use microtiter plates)
Objectives:
60X/1.42 UPlanApo oil (hand-picked for best performance)
60X/1.49 UPlanApo oil (Ring TIRF, wide-field) upon request
4 laser lines available: 405nm, 488nm, 568nm, and 640nm (all solid-state or diode lasers)
Note: 405nm and 640nm shared on the third camera
Applications
Live-cell imaging with temperature and CO2 control